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Often, the first step in the EBSD process after pattern collection is indexing. This allows for identification of the crystal orientation at the single volume of the sample from where the pattern was collected.
The Hough transform is used to enable band detection, which are difficult to locate by computer in the original EBSP. Once the band locations have been detected it is possible to relate these locations to the underlying crystal orientation, as angles between bands represent angles between lattice planes.
In highly symmetric materials, typically more than three bands are used to obtain and verify the orientation measurement.
There are two leading methods of indexing performed by most commercial EBSD software: triplet voting; and minimising the 'fit' between the experimental pattern and a computationally determined orientation.
A best practice guide for reliable data acquisition has been written by Professor Valerie Randle . Triplet voting involves identifying multiple 'triplets' associated with different solutions to the crystal orientation; each crystal orientation determined from each triplet receives one vote.
Should four bands identify the same crystal orientation then four four choose three votes will be cast for that particular solution.
Thus the candidate orientation with the highest number of votes will be the most likely solution to the underlying crystal orientation present.
The ratio of votes for the solution chosen as compared to the total number of votes describes the confidence in the underlying solution.
Care must be taken in interpreting this 'confidence index' as some pseudo-symmetric orientations may result in low confidence for one candidate solution vs.
Minimising the fit involves starting with all possible orientations for a triplet. More bands are included that reduces the number of candidate orientations.
As the number of bands increases, the number of possible orientations converge ultimately to one solution. The 'fit' between the measured orientation and the captured pattern can be determined.
In order to relate the orientation of a crystal, much like in X-ray diffraction , the geometry of the system must be known.
In particular the pattern centre, which describes both the distance of the interaction volume to the detector and the location of the nearest point between the phosphor and the sample on the phosphor screen.
Early work used a single crystal of known orientation being inserted into the SEM chamber and a particular feature of the EBSP was known to correspond to the pattern centre.
Later developments involved exploiting various geometric relationships between the generation of an EBSP and the chamber geometry shadow casting and phosphor movement.
Unfortunately each of these methods are cumbersome and can be prone to some systematic errors for a general operator.
Typically they can not be easily used in modern SEMs with multiple designated uses. Thus most commercial EBSD systems use the indexing algorithm combined with an iterative movement of both crystal orientation and suggested pattern centre location.
EBSD can be used to find the crystal orientation of the material located within the incident electron beam's interaction volume. Thus by scanning the electron beam in a prescribed fashion typically in a square or hexagonal grid, correcting for the image foreshortening due to the sample tilt results in many rich microstructural maps.
These maps can spatially describe the crystal orientation of the material being interrogated and can be used to examine microtexture and sample morphology.
Some of these maps describe grain orientation, grain boundary, diffraction pattern image quality. Various statistical tools can be used to measure the average misorientation , grain size, and crystallographic texture.
From this dataset numerous maps, charts and plots can be generated. From orientation data, a wealth of information can be devised that aids in the understanding of the sample's microstructure and processing history.
Recent developments include understanding: the prior texture of parent phases at elevated temperature; the storage and residual deformation after mechanical testing; the population of various microstructural features, including precipitates and grain boundary character.
There are applications where sample chemistry or phase cannot be differentiated via EDS alone because of similar composition; and structure cannot be solved with EBSD alone because of ambiguous structure solutions.
To accomplish integrated mapping, the analysis area is scanned and at each point Hough peaks and EDS region-of-interest counts are stored.
Positions of phases are determined in X-ray maps and measured EDS intensities are given in charts for each element.
For each phase the chemical intensity ranges are set to select the grains. Would you like to be called free of charge by one of our advisors?
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